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Matteo Buffolo   Dr.  Post Doctoral Researcher 
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Matteo Buffolo published an article in September 2018.
Top co-authors See all
Matteo Meneghini

293 shared publications

Department of Information Engineering,Universityof Padova,Padova, 35131,Italy

Enrico Zanoni

202 shared publications

University degli studi di Padova

Gaetano Granozzi

136 shared publications

Dipartimento di Scienze Chimiche, Università di Padova, via Marzolo 1, 35131 Padova, Italy

Donatella Carbonera

60 shared publications

Department of Chemical Sciences, University of Padova, Via F. Marzolo 1, 35131 Padua, Italy

Gian Andrea Rizzi

42 shared publications

Department of Chemical Sciences, University of Padova, via Marzolo 1, 35121 Padova, Italy

12
Publications
3
Reads
0
Downloads
13
Citations
Publication Record
Distribution of Articles published per year 
(2014 - 2018)
Total number of journals
published in
 
5
 
Publications See all
Article 0 Reads 0 Citations Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress N. Renso, M. Buffolo, C. De Santi, M. Ronzani, G. Meneghesso... Published: 01 September 2018
Microelectronics Reliability, doi: 10.1016/j.microrel.2018.06.054
DOI See at publisher website
Article 0 Reads 0 Citations Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits M. Buffolo, M. Pietrobon, C. De Santi, F. Samparisi, M.L. Da... Published: 01 September 2018
Microelectronics Reliability, doi: 10.1016/j.microrel.2018.06.058
DOI See at publisher website
Article 1 Read 0 Citations Current induced degradation study on state of the art DUV LEDs N. Trivellin, D. Monti, C. De Santi, M. Buffolo, G. Meneghes... Published: 01 September 2018
Microelectronics Reliability, doi: 10.1016/j.microrel.2018.07.145
DOI See at publisher website
Article 2 Reads 0 Citations Reliability of Blue-Emitting Eu2+-Doped Phosphors for Laser-Lighting Applications Matteo Buffolo, Carlo De Santi, Marco Albertini, Donatella C... Published: 28 August 2018
Materials, doi: 10.3390/ma11091552
DOI See at publisher website PubMed View at PubMed ABS Show/hide abstract
This paper investigates the reliability of blue-emitting phosphors for Near-UV (NUV) laser excitation. By means of a series of thermal stress experiments, and of stress under high levels of optical excitation, we have been able to identify the physical process responsible for the degradation of Eu2+-activated alkaline-earth halophosphate phosphors under typical and extreme operating conditions. In particular, for temperatures equal to or greater than 450 °C the material exhibited a time-dependent drop in the Photo-Luminescence (PL), which was attributed to the thermally induced ionization of the Eu2+ optically active centers. Several analytical techniques, including spatially and spectrally resolved PL, Electron Paramagnetic Resonance (EPR) and X-ray Photo-emission Spectroscopy (XPS) were used to support this hypothesis and to gain insight on the degradation process. By means of further tests, evidence of this degradation process was also found on samples stressed under a relatively low power density of 3 W/mm2 at 405 nm. This indicated that the optically (and thermally) induced ionization of the optically active species is the most critical degradation process for this family of phosphorescent material. The operating limits of a second-generation Eu-doped halophosphate phosphor were also investigated by means of short-term stress under optical excitation. The experimental data showed that a threshold excitation intensity for continuous pumping exists. Above this threshold, decay of the steady-state PL performance and non-recoverable degradation of the material were found to take place. This behavior is a consequence of the extremely harsh excitation regime, mainly due to the thermal management capabilities of the substrate material employed for our experimental purposes rather than from intrinsic properties of the phosphors.
Article 0 Reads 1 Citation Understanding the degradation processes of GaN based LEDs submitted to extremely high current density N. Renso, M. Meneghini, M. Buffolo, C. De Santi, G. Meneghes... Published: 01 September 2017
Microelectronics Reliability, doi: 10.1016/j.microrel.2017.06.044
DOI See at publisher website
Article 0 Reads 0 Citations Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs M. Buffolo, Matteo Meneghini, Carlo De Santi, H. Felber, N. ... Published: 01 September 2016
Microelectronics Reliability, doi: 10.1016/j.microrel.2016.07.103
DOI See at publisher website
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